Dense packing of the surface code: code deformation procedures and hook-error-avoiding gate scheduling
Fujiu, Kohei, Nagayama, Shota, Nishio, Shin, Kawaguchi, Hideaki, Satoh, Takahiko
Abstract
Kohei Fujiu, 1 Shota Nagayama, 2 Shin Nishio,1, 3 Hideaki Kawaguchi, 1 and Takahiko Satoh 4 Graduate School of Science and Technology, Keio University, Yokohama, Kanagawa, 223-8522, Japan Graduate School of Media Design, Keio University, Yokohama, Kanagawa, 223-0061, Japan Department of Physics & Astronomy, University College London, London, WC1E 6BT, United Kingdom Faculty of Science and Technology, Keio University, Yokohama, Kanagawa, 223-8522, Japan (Dated: November 11, 2025)

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