PPubMed1 Jan 2015Cited 17×

Diffuse multiple scattering Diffuse multiple scattering

A. G. A. Nisbet, G. Beutier, F. Fabrizi, B. Moser, S. P. Collins

Abstract

A new form of diffraction lines similar to Rutherford, Kikuchi and Kossel lines has been identified. They can be used to eliminate the need for sample/source matching in Lonsdale’s triple convergent line method in lattice-parameter determination.

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A new diffraction line type, diffuse multiple scattering, enables lattice‑parameter determination without matching sample and source, extending strain measurements using synchrotron X‑rays.

What’s new

i.Identification of diffuse multiple scattering (DMS) lines as a distinct diffraction phenomenon
ii.Development of a geometrical model and algorithm for calculating DMS line geometry
iii.Experimental demonstration of DMS lines on Au and Cu crystals, showing polarization dependence
iv.Application of DMS for strain measurement and lattice‑parameter determination without external divergent sources

How they did it

The authors used tunable synchrotron X‑ray radiation and a Pilatus 100k area detector to record diffraction patterns from Au(111) and Cu crystals. They developed a geometrical framework extending the Ewald construction to include diffuse scatter sources and implemented an algorithm to predict DMS line positions and polarization effects.

What they found

Observed DMS lines in Au(111) at 8 keV with clear σ/π polarization contrast
Measured DMS lines on Cu(111) and Cu(311) crystals at 7.82 keV, revealing surface‑cut dependent effects
Calculated a non‑coplanar triple‑intersection energy of 7.7825 keV and demonstrated its shift by 5 eV

Caveats

✕Modeling of crystal truncation rod contributions to DMS signals remains incomplete
✕Measurement precision is limited by the energy bandwidth of the synchrotron source
✕The technique currently relies on high‑flux synchrotron facilities, limiting accessibility

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