Automatic bad-pixel mask maker for X-ray pixel detectors with application to serial crystallography Automatic bad-pixel mask maker
Alireza Sadri, Marjan Hadian-Jazi, Oleksandr Yefanov, Marina Galchenkova, Henry Kirkwood, Grant Mills, Marcin Sikorski, Romain Letrun, Raphael de Wijn, Mohammad Vakili, Dominik Oberthuer, Dana Komadina, Wolfgang Brehm, Adrian P. Mancuso, Jerome Carnis, Luca Gelisio, Henry N. Chapman, S. Boutet
Abstract
'Marina Galchenkova' 'Henry Kirkwood' 'Grant Mills' 'Marcin Sikorski' 'Romain Letrun' 'Raphael de Wijn' 'Mohammad Vakili' 'Dominik Oberthuer' 'Dana Komadina' 'Wolfgang Brehm' 'Adrian P. Mancuso' 'Jerome Carnis' 'Luca Gelisio' 'Henry N. Chapman' 'S. Boutet'] Attention is focused on perhaps the biggest bottleneck in data analysis for serial crystallography at X-ray free-electron lasers, which has not received serious enough examination to date. An effective and reliable way is presented to identify anomalies in detectors, using machine learning and recently developed mathematical methods in the field referred to as ‘robust statistics’.

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